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Electron microscopes are instruments that use a beam of electrons to provide a high resolution image. Techniques include scanning, transmission and focused ion beam electron microscopy, and X-ray microtomography. Available in desktop size.
This mount holder which is made from machined aluminum with stainless steel Allen screws. Desgned specifically for use with 1 1/4" and 30 mm metallurgical mounts. Type: Hitachi M4
Encompass Procurement Services Non-distribution item offered as a customer accommodation; additional freight charges may apply. Learn More
A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period: 70 nm pitch, one-dimensional array. Accurate to +/- 0.25 nm. Refer to calibration certificate for actual pitch. Surface: Silicon Oxide ridges on Silicon, 4x3 mm die. Ridge height (about 35 nm) and width (about 35 nm) are not calibrated. Model 70-1D with Certificate. Choice of mount.
Encompass Procurement Services Non-distribution item offered as a customer accommodation; additional freight charges may apply. Learn More